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Get Adobe Flash player High-speed XRF Analyzer SEA6000VX SIINT+Carl Zeiss Jointly Developed FIB-SEM EXSTAR X-DSC7000 for Ultimate Performance
WHAT'S NEW
NEWS RELEASE
11/12/2012 Launch of Thermal Analyzer (TG/DTA7220) with Sample Observation Capability
08/27/2012 Launch of DMS7100 Dynamic Mechanical Spectrometer
06/05/2012 Launch of the ActiveFlow system an option for ICP-OES
INFORMATION
3/15/2013 new Relocation of Tokyo Office
01/07/2013 Changes in Management
01/07/2013 Corporate Headquarters Relocation
01/01/2013 To our valued customers
12/26/2012 Notice Regarding Conclusion of Shares Transfer Agreement of SII NanoTechnology Inc.
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   •ANTEC 2013
   •SAMPE 2013
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